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|Title:||A flexible image fiber probe based speckle imaging for extraction of surface features with possible application in intra-cavity inspection||Authors:||Prasad, A. S. Guru
Matham, Murukeshan Vadakke
Chan, Kelvin H. K.
Fiber Optic Metrology
|Issue Date:||2015||Source:||Prasad, A. S. G., Matham, M. V., & Chan, K. H. K. (2015). A flexible image fiber probe based speckle imaging for extraction of surface features with possible application in intra-cavity inspection. Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015), 9524, 95242Q-. doi:10.1117/12.2190498||Abstract:||Non-destructive inspection and non-invasive interrogation of surface features has always been a subject of discussion owing to the rapid advances in engineering and medical fields. Measurement of surface features which are miniature in size, inaccessible and of complex shape, has always posed challenges to conventional types of imaging and metrological systems. This paper, presents a methodology and a miniature image fiber probe configuration based on speckle technology for imaging such surface features, with possible application in intra cavity inspection. In the present work, a metal pipe is used as a test sample representing an engineering cavity. The acquired images of the intra cavity were subjected to image processing for contouring and size estimation. An analysis on the variation in the average speckle intensity, when the speckle image passes through an image fiber, is also carried out in this work. The obtained results indicate that the proposed probe configuration and related methodology can be used for inspection of cavity features and profiles of diffusive surfaces.||URI:||https://hdl.handle.net/10356/88182
|DOI:||10.1117/12.2190498||Rights:||© 2015 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015) and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/12.2190498]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||MAE Conference Papers|
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