dc.contributor.authorDhabu, Sumedh Somnath
dc.contributor.authorZheng, Yue
dc.contributor.authorLiu, Wenye
dc.contributor.authorChang, Chip Hong
dc.identifier.citationDhabu, S. S., Zheng, Y., Liu, W., & Chang, C. H. (2018). Active IC metering of digital signal processing subsystem with two-tier activation for secure split test. 2018 IEEE International Symposium on Circuits and Systems (ISCAS). doi:10.1109/ISCAS.2018.8351390en_US
dc.description.abstractActive integrated circuit (IC) metering is a class of hardware security protocols that enables the designer to track the number of chips produced from the same mask and remotely activate only the desired ones. This paper reviews existing IC metering approaches to incorporate the advantages of individual methods into a secure functional lock on digital signal processing submodule of wireless communication system to avoid legitimate channel exploitation and the risk of deploying unreliable out-of-specs gray market ICs. Our method makes use of aging-sensitive physical unclonable function to enable a two-tier activation of ICs in split test flow to track chip supply after production tests. Extraneous states are inserted into the state-space mapping of digital signal processing submodule as opposed to controller to provide a stronger state dependency on datapath and input signal. The scheme is illustrated experimentally on a pulse shaping filter of the transmitter for a wireless communication system.en_US
dc.description.sponsorshipMOE (Min. of Education, S’pore)en_US
dc.format.extent5 p.en_US
dc.rights© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/ISCAS.2018.8351390].en_US
dc.subjectPhysical Unclonable Functionsen_US
dc.subjectTwo-tier Activationen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineeringen_US
dc.titleActive IC metering of digital signal processing subsystem with two-tier activation for secure split testen_US
dc.typeConference Paper
dc.contributor.conference2018 IEEE International Symposium on Circuits and Systems (ISCAS)en_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.versionAccepted versionen_US

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