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Title: Phase retrieval in arbitrarily shaped aperture with the transport-of-intensity equation
Authors: Huang, Lei
Zuo, Chao
Idir, Mourad
Qu, Weijuan
Asundi, Anand
Keywords: Transport-of-intensity Equation
DRNTU::Engineering::Mechanical engineering
Phase Retrieval
Issue Date: 2015
Source: Huang, L., Zuo, C., Idir, M., Qu, W., & Asundi, A. (2015). Phase retrieval in arbitrarily shaped aperture with the transport-of-intensity equation. Proceedings of SPIE - Computational Imaging XIII, 9401, 94010B-. doi:10.1117/12.2087754
Abstract: Phase is not easy to detect directly as intensity, but sometimes it contains the really desired information. The transport-of-intensity equation (TIE) is a powerful tool to retrieve the phase from the intensity. However, by considering the boundary energy exchange and the whole energy conversation in the field of view, the current popular Fast Fourier transform (FFT) based TIE solver can only retrieve the phase under homogeneous Neumann boundary condition. For many applications, the boundary condition could be more complex and general. A novel TIE phase retrieval method is proposed to deal with an optical field under a general boundary condition. In this method, an arbitrarily-shape hard aperture is added in the optical field. In our method, the TIE is solved by using iterative discrete cosine transforms (DCT) method, which contains a phase compensation mechanism to improve the retrieval results. The proposed method is verified in simulation with an arbitrary phase, an arbitrarily-shaped aperture, and non-uniform intensity distribution. Experiment is also carried out to check its feasibility and the method proposed in this work is very easy and straightforward to use in a practical measurement as a flexible phase retrieval tool.
DOI: 10.1117/12.2087754
Rights: © 2015 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - Computational Imaging XIII and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: []. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
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