Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/89182
Title: Quantification of biofilm thickness using a swept source based optical coherence tomography system
Authors: Meleppat, Ratheesh Kumar
Murukeshan, Vadakke Matham
Seah, Leong Keey
Shearwood, Christopher
Keywords: Optical Frequency Domain Reflectometry
Optical Coherence Tomography
DRNTU::Engineering::Mechanical engineering
Issue Date: 2015
Source: Meleppat, R. K., Murukeshan, V. M., Seah, L. K., & Shearwood, C. (2015). Quantification of biofilm thickness using a swept source based optical coherence tomography system. Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015), 9524, 95242L-. doi:10.1117/12.2190106
Abstract: Optical coherence tomography (OCT) is a non-invasive, non-contact optical measurement and imaging technique that relies on low coherence interferometry. Apart from bio-imaging applications, the applicability of OCT can be extended to metrological investigations because of the inherent capability of optical interferometry to perform precise measurement with high sensitivity. In this paper, we demonstrate the feasibility of OCT for the measurement of the refractive index and thickness of bacterial biofilm structures grown in a flow cell. In OCT, the depth profiles are constructed by measuring the magnitude and time delay of back reflected light from the scattering sites by means of optical interferometry. The optical distance between scattering points can be obtained by measuring the separation between the point spread functions (PSF) at the respective points in the A-scan data. The refractive index of the biofilm is calculated by measuring the apparent shift in the position of the PSF corresponding to a reference surface, caused by the biofilm growth. In our experiment, the base layer of the flow cell is used as the reference surface. It is observed that the calculated refractive index of the biofilm is close to that of water, and agrees well with the previously reported value. Finally, the physical thickness of the biofilm is calculated by dividing the optical path length by the calculated value of refractive index.
URI: https://hdl.handle.net/10356/89182
http://hdl.handle.net/10220/47016
DOI: 10.1117/12.2190106
Rights: © 2015 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015) and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/12.2190106]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Conference Papers

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.