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|Title:||Speckle referencing: digital speckle pattern interferometry (SR- DSPI) for imaging of non-diffusive surfaces||Authors:||Matham, Murukeshan Vadakke
Chan, Kelvin H. K.
|Issue Date:||2015||Source:||Song, C., Matham, M. V., & Chan, K. H. K. (2015). Speckle referencing: digital speckle pattern interferometry (SR- DSPI) for imaging of non-diffusive surfaces. Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015), 9524, 95242P-. doi:10.1117/12.2190504||Abstract:||Optical metrology has been widely employed as a key technique for modern industrial production, owing to its fast, precise and non-invasive measurement. Digital speckle pattern interferometry (DSPI) is one of these non-destructive testing methods that possess the abilities to measure surface deformation, vibration and profile. However, one of the challenges with DSPI is the incapability to address the imaging of non-diffusive surface, owing to the failure to form speckle pattern. In this paper, we demonstrate a modified DSPI system used for non-diffusive surface measurement. Experiment has been carried out to validate this modified DSPI by using metal-alloy surface as testing sample. The speckle fringe pattern generated by applying an external load was analyzed to obtain the 3-D surface deformation parameters.||URI:||https://hdl.handle.net/10356/89491
|DOI:||http://dx.doi.org/10.1117/12.2190504||Rights:||© 2015 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015) and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/12.2190504]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||MAE Conference Papers|
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