Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/103389
Title: A self-healing redundancy scheme for mission/safety-critical applications
Authors: Balasubramanian, Padmanabhan
Maskell, Douglas Leslie
Keywords: Fault Tolerance
DRNTU::Engineering::Computer science and engineering
Redundancy
Issue Date: 2018
Source: Balasubramanian, P., & Maskell, D. L. (2018). A self-healing redundancy scheme for mission/safety-critical applications. IEEE Access, 6, 69640-69649. doi:10.1109/ACCESS.2018.2880763
Series/Report no.: IEEE Access
Abstract: In the nanoelectronics era, multiple faults or failures in circuits and systems deployed in mission- and safety-critical applications, such as space, aerospace, nuclear etc., are known to occur. To withstand these, higher order redundancy is suggested to be used selectively in the sensitive portions of a circuit or system. In this context, the distributed minority and majority voting based redundancy (DMMR) scheme was proposed as an alternative to the N-modular redundancy (NMR) scheme for the efficient implementation of higher order redundancy. However, the DMMR scheme is not self-healing. In this paper, we present a new self-healing redundancy (SHR) scheme that can inherently correct its internal faults or failures without any external intervention, which makes it ideal for mission/safety-critical applications. To achieve the same degree of fault tolerance, the SHR scheme requires fewer function blocks than the NMR and DMMR schemes. We present the architectures of the proposed SHR scheme, discuss the system reliability, and provide the design metrics estimated for example SHR systems alongside the corresponding NMR and DMMR systems using a 32/28-nm CMOS technology. From the perspectives of fault tolerance, self-healing capability, and optimizations in the design metrics, the SHR scheme is preferable to the NMR and DMMR schemes.
URI: https://hdl.handle.net/10356/103389
http://hdl.handle.net/10220/47290
DOI: http://dx.doi.org/10.1109/ACCESS.2018.2880763
Rights: © 2018 IEEE. Translations and content mining are permitted for academic research only. Personal use is also permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Journal Articles

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