Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/85219
Title: A return-to-zero DAC with tri-state switching scheme for multiple nyquist operations
Authors: Jung, Yun-Hwan
Yoo, Taegeun
Hong, Yohan
Yun, Jaecheol
Kim, Ju Eon
Jo, Youngkwon
Baek, Kwang-Hyun
Yoon, Dong-Hyun
Lee, Sung-min
Kim, Yong Sin
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Return-to-zero
Digital-to-analog Converter
Issue Date: 2017
Source: Yun, J., Jung, Y.-H., Yoo, T., Hong, Y., Kim, J. E., Yoon, D.-H., . . . Baek, K.-H. (2017). A return-to-zero DAC with tri-state switching scheme for multiple nyquist operations. Journal of Semiconductor Technology and Science, 17(3), 378-386. doi:10.5573/JSTS.2017.17.3.378
Series/Report no.: Journal of Semiconductor Technology and Science
Abstract: A return-to-zero (RZ) digital-to-analog converter (DAC) with a tri-state switching scheme is proposed in this paper. The proposed scheme provides a triple weight output for RZ operation by using a conventional differential current switch and simple pseudo-differential F/Fs. The RZ function is realized with only two additional transistors in each F/F cell, which results in a power dissipation increase of less than 5%. To verify the performance of the proposed method, a 10-bit RZ DAC is fabricated using standard 180-nm CMOS technology. Measured results show that the worst SFDR performances are 60 dBc and 55 dBc in the 1st and 2nd Nyquist bands, respectively, when operating at 650 MHz clock frequency. The total power consumption is 64 mW, and the active area occupies 0.25mm².
URI: https://hdl.handle.net/10356/85219
http://hdl.handle.net/10220/48196
ISSN: 1598-1657
DOI: 10.5573/JSTS.2017.17.3.378
Rights: © 2017 The Institute of Electronics and Information Engineers. All rights reserved. This paper was published in Journal of Semiconductor Technology and Science and is made available with permission of The Institute of Electronics and Information Engineers.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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