Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/88938
Title: One-stop measurement model for fast and accurate tensor display characterization
Authors: Surman, Phil
Wang, Shizheng
Yuan, Junsong
Zheng, Yuanjin
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Displays
Spatial Filtering
Issue Date: 2018
Source: Surman, P., Wang, S., Yuan, J., & Zheng, Y. (2018). One-stop measurement model for fast and accurate tensor display characterization. Journal of the Optical Society of America A, 35(2), 346-355. doi:10.1364/JOSAA.35.000346
Series/Report no.: Journal of the Optical Society of America A
Abstract: Many light field displays are fundamentally different from other displays in that they do not have quantized pixels, quantized angular outputs, or a physical screen position, which can make definitions and characterization problematic. We have determined that it is more appropriate to express the spatial resolution in terms of spatial cutoff frequency rather than a physical distance as in the case of a display with actual quantized pixels. This concept is then extended to also encompass angular resolution. The technique exploits the fact that when spatial resolution of a sinusoidal grating pattern is halved, its contrast ratio is reduced by a known proportion. An improved model, based on an earlier design concept, has been developed. It not only can be used to measure spatial and angular cutoff frequencies, but also can enable comprehensive characterization of the display. This model provides fast, simple measurement with good accuracy. It does not use special equipment or require time-consuming subjective evaluations. Using the model to characterize images in a rapid, accurate manner validates the effectiveness of this technique.
URI: https://hdl.handle.net/10356/88938
http://hdl.handle.net/10220/48347
ISSN: 1084-7529
DOI: 10.1364/JOSAA.35.000346
Rights: © 2018 Optical Society of America. All rights reserved. This paper was published in Journal of the Optical Society of America A and is made available with permission of Optical Society of America.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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