Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/90235
Title: All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits
Authors: Park, Gyusung
Kim, Minsu
Kim, Chris H.
Kim, Bongjin
Reddy, Vijay
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Bias Temperature Instability
Hot Carrier Injection
Issue Date: 2018
Source: Park, G., Kim, M., Kim, C. H., Kim, B., & Reddy, V. (2018). All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits. 2018 IEEE International Reliability Physics Symposium (IRPS), 5C.21-5C.26. doi:10.1109/IRPS.2018.8353613
Abstract: Using simple on-chip monitoring circuits, we precisely characterized the impact of hot carrier injection and bias temperature instability on frequency and phase noise degradation of a 65nm all-digital PLL circuit. Experimental data shows that PLL phase noise degrades with aging even though the output frequency is maintained constant due to the PLL feedback operation. Results show that applying high temperature annealing can recover most of the phase noise degradation.
URI: https://hdl.handle.net/10356/90235
http://hdl.handle.net/10220/48505
DOI: http://dx.doi.org/10.1109/IRPS.2018.8353613
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/IRPS.2018.8353613
metadata.item.grantfulltext: open
metadata.item.fulltext: With Fulltext
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