Please use this identifier to cite or link to this item:
Title: Simplified tape-helix analysis of the planar helix slow wave structure with straight-edge connections
Authors: Ajith Kumar, Mookkannoor Muraleedharan
Aditya, Sheel
Keywords: Dispersion Characteristics
Effective Dielectric Constant Method
DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2018
Source: Ajith Kumar, M. M., & Aditya, S. (2018). Simplified tape-helix analysis of the planar helix slow wave structure with straight-edge connections. IEEE Transactions on Electron Devices, 65(6), 2280-2286. doi:10.1109/TED.2018.2797928
Series/Report no.: IEEE Transactions on Electron Devices
Abstract: Tape-helix analysis for determining the dispersion characteristics as well as the interaction impedance of a planar helix slow-wave structure with straight edge connections (PH-SEC) is presented. The analysis is simplified by using the characteristic equation for an infinitely wide planar helix (PH) in free space and incorporating the effect of transverse confinement by straight-edge connections by applying the effective dielectric constant (EDC) method. It is shown that the results calculated from analytical expressions derived in this manner match well the simulation results obtained from CST in the frequency range far from cutoff. The EDC method is known to be inaccurate over the frequency range below cutoff. The simplified analysis is also used to determine the dispersion characteristics of a rectangular helix. The results based on the simplified analysis are shown to be more accurate than those from a previously reported complex tape-helix analysis of the rectangular helix.
ISSN: 0018-9383
DOI: 10.1109/TED.2018.2797928
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at:
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

Google ScholarTM




Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.