Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/79522
Title: “Plasmonics” in free space : observation of giant wavevectors, vortices, and energy backflow in superoscillatory optical fields
Authors: Yuan, Guanghui
Rogers, Edward T. F.
Zheludev, Nikolay I.
Keywords: Electromagnetic Fields
Nanoparticles
DRNTU::Science::Physics
Issue Date: 2019
Source: Yuan, G., Rogers, E. T. F., & Zheludev, N. I. (2019). “Plasmonics” in free space : observation of giant wavevectors, vortices, and energy backflow in superoscillatory optical fields. Light: Science & Applications, 8(1), 2-. doi:10.1038/s41377-018-0112-z
Series/Report no.: Light: Science & Applications
Abstract: Evanescent light can be localized at the nanoscale by resonant absorption in a plasmonic nanoparticle or taper or by transmission through a nanohole. However, a conventional lens cannot focus free-space light beyond half of the wavelength λ. Nevertheless, precisely tailored interference of multiple waves can form a hotspot in free space of an arbitrarily small size, which is known as superoscillation. Here, we report a new type of integrated metasurface interferometry that allows for the first time mapping of fields with a deep subwavelength resolution ~λ/100. The findings reveal that an electromagnetic field near the superoscillatory hotspot has many features similar to those found near resonant plasmonic nanoparticles or nanoholes: the hotspots are surrounded by nanoscale phase singularities and zones where the phase of the superoscillatory field changes more than tenfold faster than a free-propagating plane wave. Areas with high local wavevectors are pinned to phase vortices and zones of energy backflow (~λ/20 in size) that contribute to tightening of the main focal spot size beyond the Abbe–Rayleigh limit. Our observations reveal some analogy between plasmonic nanofocusing of evanescent waves and superoscillatory nanofocusing of free-space waves and prove the fundamental link between superoscillations and superfocusing, offering new opportunities for nanoscale metrology and imaging.
URI: https://hdl.handle.net/10356/79522
http://hdl.handle.net/10220/49060
ISSN: 2095-5545
DOI: 10.1038/s41377-018-0112-z
Rights: © 2019 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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