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|Title:||A simple model for ground surface settlement induced by braced excavation subjected to a significant groundwater drawdown||Authors:||Zhang, Wengang
Goh, Anthony Teck Chee
Ground Surface Settlement
|Issue Date:||2018||Source:||Zhang, R., Zhang, W., Goh, A. T. C., Hou, Z., & Wang, W. (2018). A simple model for ground surface settlement induced by braced excavation subjected to a significant groundwater drawdown. Geomechanics and Engineering, 16(6), 635-642. doi:10.12989/gae.2018.16.6.635||Series/Report no.:||Geomechanics and Engineering||Abstract:||Braced excavation systems are commonly required to ensure stability in construction of basements for shopping malls, underground transportation and other habitation facilities. For excavations in deposits of soft clays or residual soils, stiff retaining wall systems such as diaphragm walls are commonly adopted to restrain the ground movements and wall deflections in order to prevent damage to surrounding buildings and utilities. The ground surface settlement behind the excavation is closely associated with the magnitude of basal heave and the wall deflections and is also greatly influenced by the possible groundwater drawdown caused by potential wall leakage, flow from beneath the wall, flow from perched water and along the wall interface or poor panel connections due to the less satisfactory quality. This paper numerically investigates the influences of excavation geometries, the system stiffness, the soil properties and the groundwater drawdown on ground surface settlement and develops a simplified maximum surface settlement Logarithm Regression model for the maximum ground surface settlement estimation. The settlements estimated by this model compare favorably with a number of published and instrumented records.||URI:||https://hdl.handle.net/10356/86577
|DOI:||10.12989/gae.2018.16.6.635||Rights:||© 2018 Techno-Press, Ltd. All rights reserved. This paper was published by Techno-Press, Ltd. in Geomechanics and Engineering and is made available with permission of Techno-Press, Ltd.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||CEE Journal Articles|
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