Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/107502
Title: Experimental investigations and parametric studies of surface roughness measurements using spectrally correlated speckle images
Authors: Prabhathan, Patinharekandy
Song, Chaolong
Haridas, Aswin
Prasad, Guru
Chan, Kelvin H. K.
Murukeshan, Vadakke Mataham
Keywords: Surface Roughness
Engineering::Mechanical engineering
Spectral Speckle Correlation
Issue Date: 2017
Source: Prabhathan, P., Song, C., Haridas, A., Prasad, G., Chan, K., & Murukeshan, V. M. (2017). Experimental investigations and parametric studies of surface roughness measurements using spectrally correlated speckle images. Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering, 10449, 1044913-. doi:10.1117/12.2270539
Series/Report no.: Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering
Conference: Fifth International Conference on Optical and Photonics Engineering
Abstract: The surface roughness parameters encoded in a speckle pattern can be effectively extracted through correlation experiments. In the case of spectrally correlated speckle images, the degree of decorrelation arises from wavelength difference in the laser light irradiated on the surface. To obtain accurate results in such methodology, a proper design of experiments is important due to more than one parameter involved in the experiment. Here, experimental investigations and parametric studies of surface roughness measurements using spectral speckle correlation methodology are presented, considering the potential variables in the system. The sources of error and factors affecting the accuracy in measurement are identified and the experimental results obtained from standard calibration plate samples are presented.
URI: https://hdl.handle.net/10356/107502
http://hdl.handle.net/10220/49694
ISSN: 0277-786X
DOI: 10.1117/12.2270539
Schools: School of Mechanical and Aerospace Engineering 
Organisations: Rolls-Royce@NTU Corporate Laboratory
Rights: © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering and is made available with permission of SPIE.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles

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