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|Title:||The Young-Feynman controlled double-slit electron interference experiment||Authors:||Tavabi, Amir H.
Boothroyd, Chris B.
Gazzadi, Gian Carlo
Dunin-Borkowski, Rafal E.
Transmission Electron Microscopy
|Issue Date:||2019||Source:||Tavabi, A. H., Boothroyd, C. B., Yücelen, E., Frabboni, S., Gazzadi, G. C., Dunin-Borkowski, R. E., & Pozzi, G. (2019). The Young-Feynman controlled double-slit electron interference experiment. Scientific Reports, 9(1), 10458-. doi:10.1038/s41598-019-43323-2||Series/Report no.:||Scientific Reports||Abstract:||The key features of quantum mechanics are vividly illustrated by the Young-Feynman two-slit thought experiment, whose second part discusses the recording of an electron distribution with one of the two slits partially or totally closed by an aperture. Here, we realize the original Feynman proposal in a modern electron microscope equipped with a high brightness gun and two biprisms, with one of the biprisms used as a mask. By exciting the microscope lenses to conjugate the biprism plane with the slit plane, observations are carried out in the Fraunhofer plane with nearly ideal control of the covering of one of the slits. A second, new experiment is also presented, in which interference phenomena due to partial overlap of the slits are observed in the image plane. This condition is obtained by inserting the second biprism between the two slits and the first biprism and by biasing it in order to overlap their images.||URI:||https://hdl.handle.net/10356/85328
|DOI:||http://dx.doi.org/10.1038/s41598-019-43323-2||Rights:||© 2019 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. Te images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.||metadata.item.grantfulltext:||open||metadata.item.fulltext:||With Fulltext|
|Appears in Collections:||MSE Journal Articles|
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