Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/102639
Title: Miniaturized wideband coupler for 60-GHz band in 65-nm CMOS technology
Authors: Chew, Peng Siew
Ma, Kaixue
Kong, Zhi Hui
Yeo, Kiat Seng
Keywords: 60 GHz
Coupler
Engineering::Electrical and electronic engineering
Issue Date: 2018
Source: Chew, P. S., Ma, K., Kong, Z. H., & Yeo, K. S. (2018). Miniaturized wideband coupler for 60-GHz band in 65-nm CMOS technology. IEEE Microwave and Wireless Components Letters, 28(12), 1089-1091. doi:10.1109/LMWC.2018.2875351
Series/Report no.: IEEE Microwave and Wireless Components Letters
Abstract: A compact and wideband coupler for the 60-GHz frequency band applications using 65-nm CMOS technology is presented. By meandering the coupled line, a miniaturized coupler can be obtained. The proposed coupler achieves a measured insertion loss between the input port and the through port (S 21 ) of 6.3 dB and between the input port and the coupled port (S 31 ) of 5.6 dB at 60 GHz. The measured amplitude imbalance and phase difference are 0.75 dB and 92°, respectively, at 60 GHz. Overall, the proposed coupler can achieve a measured amplitude imbalance of <;1 dB, phase imbalance of <;4°, return loss, and isolation better than 13 and 20 dB, respectively, from 50 to 67 GHz. In addition, the proposed coupler occupies a core area of only 156 μm × 157 μm (0.024 mm 2 ).
URI: https://hdl.handle.net/10356/102639
http://hdl.handle.net/10220/50279
ISSN: 1531-1309
DOI: 10.1109/LMWC.2018.2875351
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/LMWC.2018.2875351
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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