Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/107598
Title: Descrambling of embedded SRAM using a laser probe
Authors: Chef, Samuel
Chua, Chung Tah
Tay, Jing Yun
Siah, Yu Wen
Bhasin, Shivam
Breier, J.
Gan, Chee Lip
Keywords: Random Access Memory
Transistors
Engineering::Materials
Issue Date: 2018
Source: Chef, S., Chua, C. T., Tay, J. Y., Siah, Y. W., Bhasin, S., Breier, J., & Gan, C. L. (2018). Descrambling of embedded SRAM using a laser probe. 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). doi:10.1109/IPFA.2018.8452604
Abstract: Understanding the organization of memory is a mandatory first step in various fields of applications such as failure analysis, defect localization, qualification and testing of space electronics, and security evaluation. For the last category, localization of specific addresses may be used for content estimation or encryption key recovery, with several techniques being reported for this task. In this paper, we discuss the application of laser probing for descrambling memory embedded in 8 bits microcontrollers designed and manufactured by different companies in various technology nodes.
URI: https://hdl.handle.net/10356/107598
http://hdl.handle.net/10220/50353
DOI: 10.1109/IPFA.2018.8452604
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/IPFA.2018.8452604
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MSE Conference Papers
TL Conference Papers

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