dc.contributor.authorWu, Ting
dc.contributor.authorFoo, Say Wei
dc.date.accessioned2009-07-29T08:55:47Z
dc.date.available2009-07-29T08:55:47Z
dc.date.copyright1999en_US
dc.date.issued1999
dc.identifier.citationWu, T., & Foo, S. W. (1999). An efficient method for parametric yield gradient estimation. In Proceedings of the IEEE International Symposium on Circuits and Systems, (pp. 419-422). Singapore: National University of Singapore.en_US
dc.identifier.urihttp://hdl.handle.net/10220/5850
dc.description.abstractA novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller variance. The additional computation is almost negligible. Examples are presented to indicate the efficiency of this approach.en_US
dc.format.extent4 p.en_US
dc.language.isoenen_US
dc.rights© IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/siteen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering
dc.titleAn efficient method for parametric yield gradient estimationen_US
dc.typeConference Paper
dc.contributor.conferenceIEEE International Symposium on Circuits and Systems (1999 : Orlando, Florida, US)en_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/ISCAS.1999.777897
dc.description.versionPublished versionen_US


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