Limit on the addressability of fault-tolerant nanowire decoders
Chee, Yeow Meng
Ling, Alan C. H.
Date of Issue2009
School of Physical and Mathematical Sciences
Although prone to fabrication error, the nanowire crossbar is a promising candidate component for next-generation nanometer-scale circuits. In the nanowire crossbar architecture, nanowires are addressed by controlling voltages on the mesowires. For area efficiency, we are interested in the maximum number of nanowires N(m,e) that can be addressed by m mesowires in the face of up to e fabrication errors. Asymptotically tight bounds on N(m,e) are established in this paper. In particular, it is shown that N(m,e)= Θ(2^m/m^(e+1/2)). Interesting observations are made on the equivalence between this problem and the problem of constructing optimal error-correcting and all unidirectional error-detecting (EC/AUED) codes, superimposed distance codes, pooling designs, and diffbounded set systems. Results in this paper also improve upon those in the EC/AUED code literature.
IEEE transactions on computers
IEEE Transactions on Computers © copyright 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site.