View Item 
      •   Home
      • 1. Schools
      • College of Engineering
      • School of Electrical and Electronic Engineering (EEE)
      • EEE Conference Papers
      • View Item
      •   Home
      • 1. Schools
      • College of Engineering
      • School of Electrical and Electronic Engineering (EEE)
      • EEE Conference Papers
      • View Item
      JavaScript is disabled for your browser. Some features of this site may not work without it.
      Subject Lookup

      Browse

      All of DR-NTUCommunities & CollectionsTitlesAuthorsBy DateSubjectsThis CollectionTitlesAuthorsBy DateSubjects

      My Account

      Login

      Statistics

      Most Popular ItemsStatistics by CountryMost Popular Authors

      About DR-NTU

      Design of SPST/SPDT switches in 65nm CMOS for 60GHz applications

      Thumbnail
      Design of T-R switch in 65-nm CMOS for 60-GHz applications.pdf (224.1Kb)
      Author
      He, Jin
      Zhang, Yue Ping
      Date of Issue
      2008
      Conference Name
      Asia Pacific Microwave Conference (2008 : Hong Kong, China)
      School
      School of Electrical and Electronic Engineering
      Version
      Published version
      Abstract
      This paper presents novel single-pole-single-throw (SPST) and single-pole-double-throw (SPDT) switches for 57-66GHz band applications. At 60GHz band, the SPST switch exhibits an insertion loss of 1.6dB, a return loss of 16dB, an isolation of 27dB and an input 1-dB compression point (IP1dB) of 11dBm; Correspondingly, the SPDT switch achieves an insertion loss of 3dB/2.5dB, a return loss of 12.5dB/12dB, an isolation of 22dB/22dB and an input P1dB of 12dBm/13dBm in the Tx/Rx mode, respectively. The switches are designed and implemented with STMicroelectronics 1.2V 65nm CMOS RF process.
      Subject
      DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials
      Type
      Conference Paper
      Rights
      © 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
      Collections
      • EEE Conference Papers
      http://dx.doi.org/10.1109/APMC.2008.4958340
      Get published version (via Digital Object Identifier)

      Show full item record


      NTU Library, Nanyang Avenue, Singapore 639798 © 2011 Nanyang Technological University. All rights reserved.
      DSpace software copyright © 2002-2015  DuraSpace
      Contact Us | Send Feedback
      Share |    
      Theme by 
      Atmire NV
       

       


      NTU Library, Nanyang Avenue, Singapore 639798 © 2011 Nanyang Technological University. All rights reserved.
      DSpace software copyright © 2002-2015  DuraSpace
      Contact Us | Send Feedback
      Share |    
      Theme by 
      Atmire NV
       

       

      DCSIMG