dc.contributor.authorChang, Richard Weng Yew
dc.contributor.authorSee, Kye Yak
dc.contributor.authorBo, Hu
dc.date.accessioned2010-08-30T09:03:36Z
dc.date.available2010-08-30T09:03:36Z
dc.date.copyright2008en_US
dc.date.issued2008
dc.identifier.citationChang, R. W. Y., See, K. Y, & Bo, H. (2008). In-circuit impedance measurement based on a two-probe approach. In proceedings of the Electrical Design of Advanced Packaging and Systems Symposium: Seoul, South Korea, (pp.35-38).
dc.identifier.urihttp://hdl.handle.net/10220/6370
dc.description.abstractMost impedance measurement instruments usually measure the impedance of a component or device under no-load condition. Therefore, any non-linear behaviour and other on board circuit components or parasitic are not detected or taken into consideration. Based on a novel two-probe measurement technique, the impedance of any in-circuit component can be measured with ease. Using the resistor characterization as a preliminary study, the proposed technique is able to accurately determine the impedance of the in-circuit resistor at the intended operating condition up to 1 GHz.en_US
dc.format.extent4 p.en_US
dc.language.isoenen_US
dc.rights© 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials
dc.titleIn-circuit impedance measurement based on a two-probe approachen_US
dc.typeConference Paper
dc.contributor.conferenceElectrical Design of Advanced Packaging and Systems Symposium (2008 : Seoul, South Korea)en_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/EDAPS.2008.4735992
dc.description.versionPublished versionen_US
dc.contributor.organizationGuided Systems Division, DSO National Laboratoriesen_US


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