Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/91842
Title: Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
Authors: Liu, Zhen
Chen, Tupei
Liu, Yang
Ding, Liang
Yang, Ming
Wong, Jen It
Cen, Zhan Hong
Li, Yibin
Zhang, Sam
Fung, Stevenson Hon Yuen
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
Issue Date: 2008
Source: Liu, Z., Chen, T. P., Liu, Y., Ding, L., Yang, M., Wong, J. I., et al. (2008). Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals. Applied Physics Letters, 92, 1-3.
Series/Report no.: Applied physics letters
Abstract: Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc-Al/AlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination.
URI: https://hdl.handle.net/10356/91842
http://hdl.handle.net/10220/6402
ISSN: 0003-6951
DOI: http://dx.doi.org/10.1063/1.2828691
Rights: Applied Physics Letters © copyright 2008 American Institute of Physics. The journal's website is located at http://apl.aip.org/applab/v92/i1/p013102_s1?isAuthorized=no
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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