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Title: Temporal wavelet analysis for deformation measurement of small components using micro-ESPI
Authors: Fu, Yu
Tay, Cho Jui
Quan, Chenggen
Chen, Lujie
Keywords: DRNTU::Science::Physics::Optics and light
Issue Date: 2005
Source: Fu, Y., Tay, C. J., Quan, C., & Chen, L. (2005). Temporal wavelet analysis for deformation measurement of small components using micro-ESPI, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics (Singapore): 5852, pp.559-565.
Abstract: Measuring continuous deformation of specimens whose dimensions are in the range of sub-millimeter introduces a number of difficulties using laser speckle interferometry. During deformation, the speckle patterns recorded on a camera sensor change constantly. These time-dependent speckle patterns would provide the deformation history of the object. However, compared to large objects, noise effect is much more serious due to the high magnification. In this study, a series of speckle patterns on small objects are captured during deformation by high speed camera and the temporal intensity variation of each pixel is analyzed by a robust mathematical tool --- complex Morlet wavelet transform instead of conventional Fourier transform. The transient velocity and displacement of each point can be retrieved without the need for temporal or spatial phase unwrapping process. Displacements obtained are compared with those from temporal Fourier transform, and the results show that wavelet transform minimize the influence of noise and provide better results.
Rights: Copyright 2005 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Conference Papers

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