Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/92214
Title: Vibration measurement by use of wavelet transform and temporal carrier technique
Authors: Quan, Chenggen
Fu, Yu
Tay, Cho Jui
Keywords: DRNTU::Science::Physics::Optics and light
Issue Date: 2007
Source: Quan, C., Fu, Y., & Tay, C. J. (2007). Vibration measurement by use of wavelet transform and temporal carrier technique. Measurement Science and technology, 18(16), 1718-1734.
Series/Report no.: Measurement Science and technology
Abstract: In this paper, two optical techniques, namely, electronic speckle pattern interferometry (ESPI) and fringe projection, are described for the measurement of a low-frequency vibrating object. The combination of optical interferometry and temporal phase analysis allows the measurement on a continuously deforming object without the spatial phase unwrapping process. A series of speckle or fringe patterns is captured by a high-speed CCD camera, and the intensity variation of each pixel on the recorded images is analysed along the time axis using the temporal wavelet transform method that has the property of adaptive band-pass filtering of a measured signal. However, the wavelet transform method is unable to determine the sign of a phase and it is difficult to analyse a part of the object that is not moving. The sign ambiguity problem can be overcome by adding a temporal carrier in the image acquisition process. In the ESPI, a temporal carrier is introduced by a PZT stage in the reference beam of the interferometer. In the fringe projection technique, a laterally shifted fringe pattern is projected on a vibrating object. After the temporal carrier is removed, the absolute displacement of a vibrating object is obtained without the need for a temporal or spatial phase unwrapping process.
URI: https://hdl.handle.net/10356/92214
http://hdl.handle.net/10220/6486
DOI: http://dx.doi.org/10.1088/0957-0233/18/6/S08
Rights: This is the author created version of a work that has been peer reviewed and accepted for publication by Measurement Science and technology, IOP Publishing Ltd. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [DOI: http://dx.doi.org/10.1088/0957-0233/18/6/S08]
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Journal Articles

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