Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/91582
Title: Phase extraction from electronic speckle patterns by statistical analysis
Authors: Tay, Cho Jui
Quan, Chenggen
Chen, Lujie
Fu, Yu
Keywords: DRNTU::Science::Physics::Optics and light
Issue Date: 2004
Source: Tay, C. J., Quan, C., Chen, L., & Fu, Y. (2004). Phase extraction from electronic speckle patterns by statistical analysis. Optics Communications, 236(4-6), 259-269.
Series/Report no.: Optics communications
Abstract: In electronic speckle pattern interferometry (ESPI), speckles are information carriers as well as noise that hinders the extraction of high quality phase. This paper presents a phase extraction method based on the statistical property of speckles. Assuming that speckle related phase is a random variable having a uniform distribution, the grey level variance of a number of pixels is found to be related to the modulation intensity of a speckle pattern. The relation is used to establish a connection between the phase to be measured and the variance of grey level difference between two speckle patterns. Subsequently, a phase map wrapped in [0,π) is extracted. In order to obtain a standard 2π wrapped phase map, an initial one step phase shift is introduced. The phase value of a pixel under consideration is obtained from the grey levels of its N×N neighbouring pixels. The optimal value of N is obtained based on a qualitative analysis of the initial results. With an appropriate value of N, an accuracy of 1% can be achieved.
URI: https://hdl.handle.net/10356/91582
http://hdl.handle.net/10220/6705
ISSN: 0030-4018
DOI: http://dx.doi.org/10.1016/j.optcom.2004.03.039
Rights: This is the author created version of a work that has been peer reviewed and accepted for publication by Optics Communications, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [DOI:http://dx.doi.org/10.1016/j.optcom.2004.03.039].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Journal Articles

Files in This Item:
File Description SizeFormat 
Phase extraction from electronic speckle patterns by statistical analysis.pdf1.64 MBAdobe PDFThumbnail
View/Open

Google ScholarTM

Check

Altmetric

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.