Low symmetry monoclinic MC phase in epitaxial BiFeO3 thin films on LaSrAlO4 substrates
Date of Issue2010
School of Materials Science and Engineering
We reported that the tetragonal-like phase identified in strained epitaxial BiFeO3 films on a (001) LaSrAlO4 single crystal substrates is monoclinic MC, based on high resolution synchrotron x-ray studies and piezoresponse force microscopy measurements. This MC phase has different symmetry with the rhombohedral-like monoclinic MA phase found in BiFeO3 films grown on low mismatch SrTiO3 substrates. Transmission electron microscopy revealed that the films on LaSrAlO4 substrates have a high crystalline quality and coherent interface.
DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
Applied physics letters
© 2010 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following DOI: http://dx.doi.org/10.1063/1.3525378. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.