Soft X-Ray absorption spectroscopy of the MgB2 boron K edge in an MgB2/Mg composite
Fischer, D. A.
Moodenbaugh, A. R.
Gu, G. D.
Davenport, James W.
Welch, David O.
Date of Issue2006
School of Materials Science and Engineering
Soft X-ray absorption spectroscopy (XAS), using uorescence yield, was used to study the boron K near edge in MgB2 superconductor. The sample consists of MgB2 crystallites randomly oriented in a magnesium matrix. Abrasion of the sample surface in vacuum provides a surface relatively free of boron-containing impurities. The intrinsic boron K near edge spectrum of the sample at a temperature of 295 K is identified. This spectrum is then compared in detail with a spectrum calculated using the full potential linearized augmented plane wave method. Features predicted by the theory appear near the expected energies, with qualitative agreement regarding shape and intensity.
DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Modern physics letters B
© 2006 World Scientific Publishing. This is the author created version of a work that has been peer reviewed and accepted for publication by Modern Physics Letters B, World Scientific Publishing. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: http://dx.doi.org/10.1142/S0217984906011736.