Charge transfer dynamics in Cu-doped ZnO nanowires
Sie, Edbert Jarvis
Ye, Quan Lin
Huan, Alfred Cheng Hon
Sum, Tze Chien
Date of Issue2011
School of Physical and Mathematical Sciences
Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an ultrafast charge transfer (CT) process, with an electron localization time constant 39+-9 ps, between the ZnO host and the Cu dopants in Cu-doped ZnO nanowires. This CT process effectively competes with the ZnO band edge emission, resulting in the quenching of the ZnO UV emission. TRPL measurements show that the UV decay dynamics coincides with the buildup of the Cu-related green emission. TA measurements probing the state-filling of the band edge and defect states provide further support to the CT model where the bleaching dynamics concur with the TRPL lifetimes.
Applied physics letters
© 2011 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following DOI: http://dx.doi.org/10.1063/1.3558912. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.