dc.contributor.authorDing, Yi
dc.contributor.authorWang, Peng
dc.contributor.authorGoel, Lalit
dc.contributor.authorBillinton, Roy
dc.contributor.authorKarki, Rajesh
dc.date.accessioned2011-10-07T08:35:42Z
dc.date.available2011-10-07T08:35:42Z
dc.date.copyright2007en_US
dc.date.issued2007
dc.identifier.citationDing, Y., Wang, P., Goel, L., Billinton, R., & Karki, R. (2007). Reliability assessment of restructured powersystems using reliability network equivalent and pseudo-sequential simulation techniques. Electric Power Systems Research, 77(12), 1665-1671.en_US
dc.identifier.issn0378-7796en_US
dc.identifier.urihttp://hdl.handle.net/10220/7183
dc.description.abstractThis paper presents a technique to evaluate reliability of a restructured power system with a bilateral market. The proposed technique is based on the combination of the reliability network equivalent and pseudo-sequential simulation approaches. The reliability network equivalent techniques have been implemented in the Monte Carlo simulation procedure to reduce the computational burden of the analysis. Pseudo-sequential simulation has been used to increase the computational efficiency of the non-sequential simulation method and to model the chronological aspects of market trading and system operation. Multi-state Markov models for generation and transmission systems are proposed and implemented in the simulation. A new load shedding scheme is proposed during generation inadequacy and network congestion to minimize the load curtailment. The IEEE reliability test system (RTS) is used to illustrate the technique.en_US
dc.format.extent7 p.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesElectric power systems researchen_US
dc.rightsCopyrights Elsevier. The Journal's web site is located at http://www.elsevier.com/locate/epsren_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Electric power::Production, transmission and distribution
dc.titleReliability assessment of restructured power systems using reliability network equivalent and pseudo-sequential simulation techniquesen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doi10.1016/j.epsr.2006.11.010
dc.description.versionAccepted versionen_US


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