Properties of (K,Na)NbO3-based lead-free piezoelectric films prepared by pulsed laser deposition
Chua, Ngeah Theng
Date of Issue2010
School of Materials Science and Engineering
To investigate the properties of (K,Na)NbO3-based lead-free piezoelectric films at the morphotropic phase boundary composition, we fabricated epitaxial [(K0.5Na0.5)0.97Li 0.03] (Nb0.8Ta0.2)O3 films on (001), (110) and (111)-oriented single crystal SrTiO3 substrates by pulsed laser deposition. The structure and electrical properties of the films were studied. Dielectric constants of 540, 390 and 300 and remnant polarizations of 4.00, 1.05, and 0.35 μC/cm2 were observed for the (001), (110) and (111) oriented films, respectively.
Thin solid films
© 2010 Elsevier This is the author created version of a work that has been peer reviewed and accepted for publication by Thin Solid Films, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: http://dx.doi.org/10.1016/j.tsf.2010.06.016 .