Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/94807
Title: Elasticity modulus, hardness and fracture toughness of Ni3Sn4 intermetallic thin films
Authors: Chen, Zhong
He, Min
Balakrisnan, Bavani
Chum, Chan Choy
Keywords: DRNTU::Engineering::Materials
Issue Date: 2006
Source: Chen, Z., He, M., Balakrisnan, B., & Chum, C. C. (2006). Elasticity modulus, hardness and fracture toughness of Ni3Sn4 intermetallic thin films. Materials Science and Engineering A, 423(1-2), 107-110.
Series/Report no.: Materials science and engineering A
Abstract: Intermetallic compounds (IMCs) are present in microelectronic solder interconnects as a result of interfacial reaction between the solder and the metallization materials. Their mechanical properties are of great interest for the prediction of joint reliability of electronic packages. In this work, thin film Ni3Sn4 IMCs were formed by co-sputtering of Sn and Ni, followed by annealing at different temperatures. Elasticity modulus and hardness of the films were investigated by nano-indentation. It was found that measured hardness decreased with increasing residual tensile stress in the film. The elasticity modulus of the Ni3Sn4 thin films was measured to be around 134 GPa by nano-indentation. The fracture toughness of these Ni3Sn4 thin films varied considerably with the annealing temperature. It ranged from 2.11 ± 0.15 MPa m1/2 for 100 °C annealing to 5.75 ± 0.25 MPa m1/2 for 200 °C annealing. Densification during annealing is believed to be the cause of the increase in toughness.
URI: https://hdl.handle.net/10356/94807
http://hdl.handle.net/10220/8147
DOI: http://dx.doi.org/10.1016/j.msea.2005.12.038
Rights: © 2006 Elsevier. This is the author created version of a work that has been peer reviewed and accepted for publication by Materials Science and Engineering A, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1016/j.msea.2005.12.038]."
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MSE Journal Articles

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