Force titration of amino group-terminated self-assembled monolayers using chemical force microscopy
Date of Issue1998
School of Materials Science and Engineering
Chemical force microscopy (CFM) was used to measure the adhesion force between an Au-coated Si3N4 tip functionalized with OH groups and a silicon substrate functionalized with NH2 groups. The curve of the adhesion force as a function of the solution pH value (force titration curve) was obtained. The pK1=2 of surface NH2 groups estimated from the force titration curve is 7:4, about 3 pK units lower than the pK value of NH2 functionality in aqueous solution, and in nice agreement with the value of pK1=2 D 7:6 determined by conventional contact angle titration. The surface pK1=2 value that we obtained from the force titration or contact angle titration is the apparent surface pK value, which is expressed as the corresponding bulk solution pH value at which the functional groups at the interface are half-ionized.
Applied physics A : materials science & processing
© 1998 Springer. This is the author created version of a work that has been peer reviewed and accepted for publication by Applied Physics A: Materials Science & Processing, Springer. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1007/s003390051143].