dc.contributor.authorGong, Fang
dc.contributor.authorYu, Hao
dc.contributor.authorWang, Lingli
dc.contributor.authorHe, Lei
dc.date.accessioned2012-09-18T06:40:58Z
dc.date.available2012-09-18T06:40:58Z
dc.date.copyright2011en_US
dc.date.issued2011
dc.identifier.citationGong, F., Yu, H., Wang, L., & He, L. (2011). A parallel and incremental extraction of variational capacitance with stochastic geometric moments. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 20(9), 1729-1737.en_US
dc.identifier.issn1063-8210en_US
dc.identifier.urihttp://hdl.handle.net/10220/8560
dc.description.abstractThis paper presents a parallel and incremental solver for stochastic capacitance extraction. The random geometrical variation is described by stochastic geometrical moments, which lead to a densely augmented system equation. To efficiently extract the capacitance and solve the system equation, a parallel fast-multipole-method (FMM) is developed in the framework of stochastic geometrical moments. This can efficiently estimate the stochastic potential interaction and its matrix-vector product (MVP) with charge. Moreover, a generalized minimal residual (GMRES) method with incremental update is developed to calculate both the nominal value and the variance. Our overall extraction show is called piCAP. A number of experiments show that piCAP efficiently handles a large-scale on-chip capacitance extraction with variations. Specifically, a parallel MVP in piCAP is up 3 × to faster than a serial MVP, and an incremental GMRES in piCAP is up to 15× faster than non-incremental GMRES methods.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesIEEE transactions on very large scale integration (VLSI) systemsen_US
dc.rights© 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/TVLSI.2011.2161352].en_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering
dc.titleA parallel and incremental extraction of variational capacitance with stochastic geometric momentsen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/TVLSI.2011.2161352
dc.description.versionAccepted versionen_US
dc.identifier.rims162551


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record