Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers
Author
Zhang, Hua
Müllen, Klaus
De Feyter, Steven
Date of Issue
2007School
School of Materials Science and Engineering
Abstract
Pulsed-force-mode atomic force microscopy (PFM-AFM) with a chemically modified tip was employed to measure the topography and adhesion force images of homoaggregates of fourth generation polyphenylene and carboxylic-acid-functionalized second generation polyphenylene dendrimers on hydrophilic self-assembled monolayers (SAMs). Although from the AFM topographic image the dendrimers could not be discriminated, from the adhesion image, the respective homoaggregates were easily discriminated. The determination is based on the different adhesive interactions between the dendrimers and the chemically modified tip, which are related to the chemical nature of the outer-surface functional groups, and the adsorbed water layer on hydrophilic surfaces under ambient conditions. It shows that PFM-AFM with chemically modified tips has nanoscale chemical spatial resolution.
Subject
DRNTU::Engineering::Materials
Type
Journal Article
Series/Journal Title
Journal of physical chemistry C
Rights
© 2007 American Chemical Society.
Collections
http://dx.doi.org/10.1021/jp073388u
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