dc.contributor.authorZhang, Hua
dc.contributor.authorMüllen, Klaus
dc.contributor.authorDe Feyter, Steven
dc.date.accessioned2012-09-24T01:07:50Z
dc.date.available2012-09-24T01:07:50Z
dc.date.copyright2007en_US
dc.date.issued2007
dc.identifier.citationZhang, H., Müllen, K., & De Feyter, S. (2007). Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers. Journal of Physical Chemistry C, 111(23), 8142-8144.en_US
dc.identifier.issn1932-7447en_US
dc.identifier.urihttp://hdl.handle.net/10220/8605
dc.description.abstractPulsed-force-mode atomic force microscopy (PFM-AFM) with a chemically modified tip was employed to measure the topography and adhesion force images of homoaggregates of fourth generation polyphenylene and carboxylic-acid-functionalized second generation polyphenylene dendrimers on hydrophilic self-assembled monolayers (SAMs). Although from the AFM topographic image the dendrimers could not be discriminated, from the adhesion image, the respective homoaggregates were easily discriminated. The determination is based on the different adhesive interactions between the dendrimers and the chemically modified tip, which are related to the chemical nature of the outer-surface functional groups, and the adsorbed water layer on hydrophilic surfaces under ambient conditions. It shows that PFM-AFM with chemically modified tips has nanoscale chemical spatial resolution.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesJournal of physical chemistry Cen_US
dc.rights© 2007 American Chemical Society.en_US
dc.subjectDRNTU::Engineering::Materials
dc.titlePulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayersen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Materials Science and Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1021/jp073388u


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