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|Title:||An analytical method to study the effects of a substrate in surface-enhanced Raman scattering||Authors:||Huang, Shao Ying
Lee, Yee Hui
|Keywords:||DRNTU::Science::Mathematics::Number theory||Issue Date:||2009||Source:||Huang, S. Y., Wu, B. I., Zhang, B., Lee, Y. H., Liberman, V., & Rothschild, M. (2009). An analytical method to study the effects of a substrate in surface-enhanced Raman scattering. Journal of Applied Physics, 106(11).||Series/Report no.:||Journal of applied physics||Abstract:||In studies of surface-enhanced Raman scattering (SERS), individual metal nanoparticle and particle assemblies introduce enhancement of electromagnetic fields. However, the contributions to enhancement due to the substrate supporting the particles are yet to be studied analytically. In this communication, we present an analytical method to investigate the effect of a substrate with realistic layers in SERS. The proposed method quantifies the effect of a substrate on the electric field on the nanoparticles surface in SERS experiments. By applying the proposed method, optimal constructions of a substrate can be obtained to maximize the surface electric field while a poorly constructed one can be avoided. The maximization can lead to a high Raman enhancement factor. The method is verified using numerical simulations.||URI:||https://hdl.handle.net/10356/95136
|ISSN:||00218979||DOI:||10.1063/1.3264635||Rights:||© 2009 American Institute of Physics. This paper was published in Journal of Applied Physics and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: http://dx.doi.org/10.1063/1.3264635. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||SPMS Journal Articles|
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