Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/94800
Title: Optical-force-induced bistability in nanomachined ring resonator systems
Authors: Bourouina, Tarik
Yu, Y. F.
Zhang, J. B.
Liu, A. Q.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
Issue Date: 2012
Source: Yu, Y. F., Zhang, J. B., Bourouina, T., & Liu, A. Q. (2012). Optical-force-induced bistability in nanomachined ring resonator systems. Applied physics letters, 100(9).
Series/Report no.: Applied physics letters
Abstract: This paper reports optical-force-induced bistability in a nanomachined ring resonator system. It consists of two ring resonators and a bus waveguide, whereby each ring resonator has a free-hanging arc that is perpendicularly deformable by an optical force and changes the effective refractive index of the system. Therefore, an optical bistability is induced into the nanomachined ring resonator system, in which the bistability band can reach 0.3 nm and 0.68 nm in the ring resonators 1 and 2, respectively. It has potential applications in optical signal processing area, such as all-optical switching and opto-mechanical memory.
URI: https://hdl.handle.net/10356/94800
http://hdl.handle.net/10220/9135
ISSN: 0003-6951
DOI: http://dx.doi.org/10.1063/1.3690955
Rights: © 2012 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.3690955]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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