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|Title:||Domain tuning in mixed-phase BiFeO3 thin films using vicinal substrates||Authors:||Yasui, Shintaro
|Keywords:||DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films||Issue Date:||2012||Source:||You, L., Yasui, S., Ehara, Y., Zou, X., Ding, H., Chen, Z., et al. (2012). Domain tuning in mixed-phase BiFeO3 thin films using vicinal substrates. Applied Physics Letters, 100(20), 202901-.||Series/Report no.:||Applied physics letters||Abstract:||The structural and ferroelectric domain variants of highly strained BiFeO3 films grown on vicinal LaSrAlO4 substrates were studied by piezoelectric force microscopy and high-resolution x-ray reciprocal space mapping. Through symmetry breaking of the substrate surface, ferroelastic domain variants in the highly strained MC phase BiFeO3 can be greatly reduced in thinner, purely tetragonal-like films. More interestingly, in thicker, mixed phase films, the structural variants can also be tailored by substrate vicinality. These findings lead to better understanding of the phase evolution and polarization rotation process in the strain-driven polymorphic phase system.||URI:||https://hdl.handle.net/10356/99917
|ISSN:||0003-6951||DOI:||10.1063/1.4717986||Rights:||© 2012 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.4717986]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||MSE Journal Articles|
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