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|Title:||Numerical and experimental studies of coupling-induced phase shift in resonator and interferometric integrated optics devices||Authors:||Tjahjana, Liliana
Zhang, Dao Hua
Tobing, Landobasa Yosef Mario A. L.
|Issue Date:||2012||Source:||Tobing, L. Y. M. A. L., Tjahjana, L., Darmawan, S., & Zhang, D. H. (2012). Numerical and experimental studies of coupling-induced phase shift in resonator and interferometric integrated optics devices. Optics express, 20(5), 5789-5801.||Series/Report no.:||Optics Express||Abstract:||Coupling induced effects are higher order effects inherent in waveguide evanescent coupling that are known to spectrally distort optical performances of integrated optics devices formed by coupled resonators. We present both numerical and experimental studies of coupling-induced phase shift in various basic integrated optics devices. Rigorous finite difference time domain simulations and systematic experimental characterizations of different basic structures were conducted for more accurate parameter extraction, where it can be observed that coupling induced wave vector may change sign at the increasing gap separation. The devices characterized in this work were fabricated by CMOS-process 193nm Deep UV (DUV) lithography in silicon-on-insulator (SOI) technology.||URI:||https://hdl.handle.net/10356/95349
|ISSN:||1094-4087||DOI:||http://dx.doi.org/10.1364/OE.20.005789||Rights:||© 2012 Optical Society of America. This paper was published in Optics Express and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: [http://dx.doi.org/10.1364/OE.20.005789]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Journal Articles|
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