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|Title:||Elimination of spurious solutions from k·p theory with Fourier transform technique and Burt-Foreman operator ordering||Authors:||Zhao, Qiuji
Zhang, Dao Hua
|Keywords:||DRNTU::Science::Mathematics::Applied mathematics||Issue Date:||2012||Source:||Zhao, Q., Mei, T., & Zhang, D. H. (2012). Elimination of spurious solutions from k•p theory with Fourier transform technique and Burt-Foreman operator ordering. Journal of Applied Physics, 111(5), 053702-.||Series/Report no.:||Journal of applied physics||Abstract:||To eliminate spurious solutions in the multiple-band k·p theory, we developed the Fourier transform-based k·p approach through combining the Fourier transform technique with Burt-Foreman operator ordering. The performance is perfect for the six-band k·p calculation, and the spurious solutions in the conduction band met in the eight-band calculation can also be easily screened away in the inborn cut-off step in FTM, i.e., choosing a proper order of Fourier truncation. Truncating high-order terms of Fourier coefficients of the envelope function prevents the occurrence of a wild-spreading spectrum of the Fourier expansion coefficients, which can be taken as the signature of spurious solutions.||URI:||https://hdl.handle.net/10356/95137
|ISSN:||0021-8979||DOI:||http://dx.doi.org/10.1063/1.3689821||Rights:||© 2012 American Institute of Physics. This paper was published in Journal of Applied Physics and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.3689821]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Journal Articles|
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