dc.contributor.authorWoo, Chang-Su
dc.contributor.authorLee, Jin Hong
dc.contributor.authorChu, Kanghyun
dc.contributor.authorJang, Byung-Kweon
dc.contributor.authorKim, Yong-Bae
dc.contributor.authorKoo, Tae Yeong
dc.contributor.authorYang, Ping
dc.contributor.authorQi, Yajun
dc.contributor.authorChen, Zuhuang
dc.contributor.authorChen, Lang
dc.contributor.authorChoi, Hong Chul
dc.contributor.authorShim, Ji Hoon
dc.contributor.authorYang, Chan-Ho
dc.date.accessioned2013-03-07T08:18:58Z
dc.date.available2013-03-07T08:18:58Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.citationWoo, C.- S., Lee, J. H., Chu, K., Jang, B.- K., Kim, Y.- B., Koo, T. Y., et al. (2012). Suppression of mixed-phase areas in highly elongated BiFeO3 thin films on NdAlO3 substrates. Physical Review B, 86(5), 054417-.en_US
dc.identifier.urihttp://hdl.handle.net/10220/9361
dc.description.abstractMixed-phase areas are produced in highly elongated BiFeO3 (BFO) thin films as a consequence of strain relaxation. A (001) neodymium aluminate (NdAlO3; NAO) substrate (a∼3.747 Å) prominently suppresses the strain relaxation effect and prevents the formation of mixed-phase regions. This creates a pathway to the thick, quasipure, highly elongated phases required for magnetoelectric applications. We characterize the crystal structure, the interface between film and substrate, the surface morphology, and the ferroelectric domain structure of BFO films on NAO substrates and compare them with those of films on typical lanthanum aluminate substrates. The underlying mechanisms are discussed based on the intriguing nature of phase competition in bismuth ferrite phases using first principles density functional calculations for the misfit strain-dependent total energy.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesPhysical review Ben_US
dc.rights© 2012 American Physical Society. This paper was published in Physical Review B and is made available as an electronic reprint (preprint) with permission of American Physical Society. The paper can be found at the following official DOI: [http://dx.doi.org/10.1103/PhysRevB.86.054417]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en_US
dc.titleSuppression of mixed-phase areas in highly elongated BiFeO3 thin films on NdAlO3 substratesen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Materials Science and Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1103/PhysRevB.86.054417
dc.description.versionPublished versionen_US


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