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Title: Characterization of the excess noise conversion from optical relative intensity noise in the photodetection of mode-locked lasers for microwave signal synthesis
Authors: Wu, Kan
Shum, Perry Ping
Aditya, Sheel
Ouyang, Chunmei
Wong, Jia Haur
Lam, Huy Quoc
Lee, Kenneth Eng Kian
Keywords: DRNTU::Science::Physics::Optics and light
Issue Date: 2011
Source: Wu, K., Shum, P. P., Aditya, S., Ouyang, C., Wong, J. H., Lam, H. Q., & Lee, K. E. K. (2011). Characterization of the Excess Noise Conversion from Optical Relative Intensity Noise in the Photodetection of Mode-locked Lasers for Microwave Signal Synthesis. Journal of Lightwave Technology, 29(24), 3622-3631.
Series/Report no.: Journal of lightwave technology
Abstract: Excess noise converted from the optical relative intensity noise (RIN) has limited the noise performance in the microwave signal synthesis application for mode-locked lasers. In this paper, a method for detailed characterization of the excess noise conversion from the optical RIN to the electrical pulse width jitter (PWJ), electrical relative amplitude noise (RAN) and electrical phase noise in the photodetection of mode-locked lasers is proposed. With the measured noise conversion ratios, one can predict the electrical RAN and phase noise power spectral densities under different input optical powers. The effect of the pulse width and peak power of the incident optical pulses and the effect of the saturation power of the photodetectors are also investigated. The results are used to suggest guidelines for achieving low-noise photodetection for microwave signal synthesis application.
ISSN: 0733-8724
DOI: 10.1109/JLT.2011.2173464
Schools: School of Electrical and Electronic Engineering 
Rights: © 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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