Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/100924
Title: Design and analysis of CMOS-based terahertz integrated circuits by causal fractional-order RLGC transmission line model
Authors: Shang, Yang
Yu, Hao
Fei, Wei
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2013
Source: Shang, Y., Yu, H., & Fei, W. (2013). Design and analysis of CMOS-based terahertz integrated circuits by causal fractional-order RLGC transmission line model. IEEE journal on emerging and selected topics in circuits and systems, 3(3), 355-366.
Series/Report no.: IEEE journal on emerging and selected topics in circuits and systems
Abstract: A causal and compact fractional-order model is developed for complementary metal–oxide–semiconductor (CMOS) on-chip transmission line (T-line) at Terahertz (THz) frequencies. With consideration of the loss from frequency-dependent dispersion and nonquasi-static effects at THz, good agreement of characteristic impedance is observed between the proposed fractionalordermodel and the measurement up to 110 GHz, while traditional integer-order model can only match up to 10 GHz. The developed fractional-order model is further deployed in the design and analysis of CMOS-based THz integrated circuits that utilize T-line, such as standing-wave oscillator, which has significantly improved accuracy with causality.
URI: https://hdl.handle.net/10356/100924
http://hdl.handle.net/10220/18219
ISSN: 2156-3357
DOI: 10.1109/JETCAS.2013.2268948
Rights: © 2013 IEEE. This is the author created version of a work that has been peer reviewed and accepted for publication by IEEE Journal on Emerging and Selected Topics in Circuits and Systems, IEEE. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: http://dx.doi.org/10.1109/JETCAS.2013.2268948.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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