Please use this identifier to cite or link to this item:
Title: Design and characterization of low loss 50 picoseconds delay line on SOI platform
Authors: Xiao, Zhe
Luo, Xianshu
Liow, Tsung-Yang
Lim, Peng Huei
Prabhathan, Patinharekandy
Zhang, Jing
Luan, Feng
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Issue Date: 2013
Source: Xiao, Z., Luo, X., Liow, T.-Y., Lim, P. H., Prabhathan, P., Zhang, J., et al. (2013). Design and characterization of low loss 50 picoseconds delay line on SOI platform. Optics express, 21(18), 21285-21292.
Series/Report no.: Optics express
Abstract: We design and experimentally demonstrate 50 picoseconds (ps) low loss delay line on 300 nm SOI platform. The delay line unit consists of straight rib waveguide and strip bend section linked by a transition taper waveguide. Low propagation loss of ~0.1 dB/cm is achieved on the straight rib waveguide. With taking into account both low loss and desirable delay, a complete design and characterization process for passive delay line is presented. Our measurement results show that about 0.7 dB excess loss is achievable for 50 ps delay. The loss can be further reduced by adjusting the layout parameters.
ISSN: 1094-4087
DOI: 10.1364/OE.21.021285
Rights: © 2013 Optical Society of America.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

Citations 20

Updated on Jul 8, 2022

Citations 20

Updated on Jul 8, 2022

Page view(s) 10

Updated on Aug 18, 2022

Google ScholarTM




Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.