Fast full-field out-of-plane deformation measurement using fringe reflectometry

Abstract

Full-field out-of-plane deformation measurement of specular surfaces can be implemented quickly and conveniently using fringe reflectometry. The system configuration is simple and processing is fast. With the assistance of an advanced fringe pattern processing technique, the windowed Fourier ridges method, only a single two-directional fringe pattern is necessary for determination of the deformed surface profile. Thus, the whole measurement only requires a single image with the potential for high speed or even real time measurement.