Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/102398
Title: | Focused ion beam nanoscale patterned transmission-enhanced fiber-optic tips | Authors: | Wang, Houxiao Zhou, Wei Cui, Ying Wang, Guanghui Shum, Perry Ping |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering | Issue Date: | 2013 | Source: | Wang, H., Zhou, W., Cui, Y., Wang, G., & Shum, P. P. (2013). Focused ion beam nanoscale patterned transmission-enhanced fiber-optic tips. Journal of Nanoscience and Nanotechnology, 13(7), 4581-4586. | Series/Report no.: | Journal of nanoscience and nanotechnology | Abstract: | The angled and tapered antireflection and transmission-enhanced fiber-optic tips were designed, fabricated, and characterized based on nanoscale surface modification using the nano-precision focused ion beam (FIB). The developed optical fiber tips showed combined functions of antireflection and transmission enhancement for higher detection efficiency or signal-to-noise ratio because the FIB-milled nanoholes into the fiber tip endfaces could act as tapered air-filled nanopillars, changing the light propagation direction, enhancing the scattering effect, and allowing more photons to transmit along/near the glass/air interface to enhance the local evanescent field for sensing/detection. | URI: | https://hdl.handle.net/10356/102398 http://hdl.handle.net/10220/19005 |
ISSN: | 1533-4880 | DOI: | 10.1166/jnn.2013.6698 | Schools: | School of Electrical and Electronic Engineering School of Mechanical and Aerospace Engineering |
Rights: | © 2013 American Scientific Publishers. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles MAE Journal Articles |
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