Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/102472
Title: A 0.6-V high reverse-isolation through feedback self-cancellation for single-stage noncascode CMOS LNA
Authors: Tran, T. T. N.
Boon, Chirn Chye
Do, Manh Anh
Yeo, Kiat Seng
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2011
Source: Tran, T. T. N., Boon, C. C., Do, M. A., Yeo, K. S. (2011). A 0.6-V high reverse-isolation through feedback self-cancellation for single-stage noncascode CMOS LNA. Microwave and optical technology letters, 54(2), 374-379.
Series/Report no.: Microwave and optical technology letters
Abstract: In many designs, a low supply voltage is selected for efficient use of power. However, this often leads to low reverse-isolation which is critical to the RF front–end circuits and particularly to the low-noise amplifier (LNA). In this letter, a fully integrated differential low-voltage CMOS LNA with high reverse-isolation is presented. This LNA makes use of the single-stage noncascode structure and the capacitive cross-coupling (CCC) technique. The CCC technique has been utilized in many LNA designs. However, in all of the reported works using CCC, the CCC technique was mainly used to improve the noise figure (NF), not the reverse-isolation. The poor reverse-isolation problem in single-stage noncascode structure has never been analyzed in the capacitive cross-coupling cascaded low noise amplifier (CCCLNA). This work shows a novel analysis on the feedback self-cancellation mechanism to improve the reverse-isolation. Other analyses on input matching, gain and NF were also performed to show the feasibility of using CCC technique for the low-voltage LNA as well as the advantages of the CCCLNA over the conventional common-source and common-gate (CG) LNA. The LNA consumes only 0.5 mW from 0.6 V supply voltage. It achieves a gain of 14 dB and a NF of 3.55 dB.
URI: https://hdl.handle.net/10356/102472
http://hdl.handle.net/10220/11190
DOI: 10.1002/mop.26542
Schools: School of Electrical and Electronic Engineering 
Rights: © 2011 Wiley Periodicals, Inc.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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