Please use this identifier to cite or link to this item:
Title: Rationally designed hierarchical TiO2@Fe2O3 hollow nanostructures for improved lithium ion storage
Authors: Luo, Jingshan
Xia, Xinhui
Luo, Yongsong
Guan, Cao
Liu, Jilei
Qi, Xiaoying
Ng, Chin Fan
Yu, Ting
Zhang, Hua
Fan, Hong Jin
Keywords: DRNTU::Engineering::Materials
Issue Date: 2013
Source: Luo, J., Xia, X., Luo, Y., Guan, C., Liu, J., Qi, X., et al. (2013). Rationally Designed Hierarchical TiO2@Fe2O3 Hollow Nanostructures for Improved Lithium Ion Storage. Advanced Energy Materials, 3(6), 737-743.
Series/Report no.: Advanced energy materials
Abstract: Hollow and hierarchical nanostructures have received wide attention in new-generation, high-performance, lithium ion battery (LIB) applications. Both TiO2 and Fe2O3 are under current investigation because of their high structural stability (TiO2) and high capacity (Fe2O3), and their low cost. Here, we demonstrate a simple strategy for the fabrication of hierarchical hollow TiO2@Fe2O3 nanostructures for the application as LIB anodes. Using atomic layer deposition (ALD) and sacrificial template-assisted hydrolysis, the resulting nanostructure combines a large surface area with a hollow interior and robust structure. As a result, such rationally designed LIB anodes exhibit a high reversible capacity (initial value 840 mAh g−1), improved cycle stability (530 mAh g−1 after 200 cycles at the current density of 200 mA g−1), as well as outstanding rate capability. This ALD-assisted fabrication strategy can be extended to other hierarchical hollow metal oxide nanostructures for favorable applications in electrochemical and optoelectronic devices.
ISSN: 1614-6832
DOI: 10.1002/aenm.201200953
Rights: © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:MSE Journal Articles
SPMS Journal Articles

Citations 1

Updated on Jul 13, 2020

Citations 1

Updated on Mar 6, 2021

Page view(s) 20

Updated on Apr 10, 2021

Google ScholarTM




Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.