Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/102719
Title: | Robust nearfield wideband beamformer design using worst case mean performance optimization with passband response variance constraint | Authors: | Chen, Huawei Ser, Wee Zhou, Jianjiang |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering | Issue Date: | 2012 | Source: | Chen, H., Ser, W., & Zhou, J. (2012). Robust nearfield wideband beamformer design using worst case mean performance optimization with passband response variance constraint. IEEE transactions on audio, speech, and language processing, 20(5), 1565-1572. | Series/Report no.: | IEEE transactions on audio, speech, and language processing | Abstract: | Conventional wideband beamformers are known highly sensitive to gain and phase errors in microphone characteristics, especially for small-sized arrays. Recently, a robust design approach for nearfield wideband beamformers using worst case performance optimization has been proposed. However, the worst case performance optimization criterion might be overly conservative in practice, which may lead to undesired low-pass filtered distortion of target signals. In this paper, a robust design approach for nearfield wideband beamformers using the worst case mean performance optimization is proposed, which is less conservative than the existing approach. Unlike the existing robust design approaches which have no control over array response variance, the presented approach further proposes to impose the passband response variance constraint to enhance the stability of passband array response and hence to reduce the target signal distortion. Moreover, some insights into the properties of array response variance are derived, which are helpful to better understand the robustness characteristics of nearfield wideband beamformers. Design examples demonstrate the effectiveness of the proposed robust design approach. | URI: | https://hdl.handle.net/10356/102719 http://hdl.handle.net/10220/16449 |
DOI: | 10.1109/TASL.2012.2184754 | Schools: | School of Electrical and Electronic Engineering | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
SCOPUSTM
Citations
20
12
Updated on May 30, 2023
Web of ScienceTM
Citations
20
12
Updated on May 28, 2023
Page view(s) 50
546
Updated on May 31, 2023
Google ScholarTM
Check
Altmetric
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.