Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/102764
Title: An improved lithium-ion battery model with temperature prediction considering entropy
Authors: Gooi, Hoay Beng
Feng, X.
Chen, S. X.
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2012
Source: Feng, X., Gooi, H. B., & Chen, S. X. (2012). An improved lithium-ion battery model with temperature prediction considering entropy. 2012 3rd IEEE PES International Conference and Exhibition on Innovative Smart Grid Technologies Europe (ISGT Europe), pp.1-8.
Conference: IEEE PES International Conference and Exhibition on Innovative Smart Grid Technologies Europe (3rd : 2012 : Berlin, Germany)
Abstract: This paper presents a system-level simulation model of a commercially available lithium-ion battery considering temperature prediction. For the 18650 battery modeling, four equations are derived based on a typical battery equivalent circuit to characterize the discharge behaviors. Current- and temperature- dependencies, as well as the internal resistance variations are taken into account to improve the model accuracy. In our extensive simulations, the calculated battery terminal voltage as a function of the state of discharge matches well with the manufacturer's data for the 18650 battery. The original model for 18650 is properly modified to characterize the Ultralife UBBL 10 battery package assembled by cylindrical 18650 batteries. The model uses a simplified equivalent circuit and modified correction factors to improve the precision. Compared with our measurement data on UBBL 10, the simulated results using our proposed model shows small deviations in both charging and discharging characteristics. Moreover, due to the considerations of the internal resistance changes and entropic heat in the thermal dynamic description, the model is able to predict the battery temperature to circumvent the safety concerns on undesirable temperature rise.
URI: https://hdl.handle.net/10356/102764
http://hdl.handle.net/10220/16414
DOI: 10.1109/ISGTEurope.2012.6465668
Schools: School of Electrical and Electronic Engineering 
Rights: © 2012 IEEE
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Conference Papers

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