Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/102789
Title: Rapid light output degradation of GaN-based packaged LED in the early stage of humidity test
Authors: Chen, B. K.
Li, X.
Tan, Cher Ming
Chen, Sihan Joseph
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2011
Source: Tan, C. M., Chen, B. K., Li, X., & Chen, S. J. (2011). Rapid Light Output Degradation of GaN-Based Packaged LED in the Early Stage of Humidity Test. IEEE Transactions on Device and Materials Reliability, 12(1), 44-48.
Series/Report no.: IEEE transactions on device and materials reliability
Abstract: An initial sharp decrease in the light output of a high-power light-emitting diode is observed when it is exposed to humid condition. TGA and energy-dispersive system analyses confirm the possibility of moisture entrapment in the silicone encapsulation; moreover, the light scattering model verifies qualitatively the scattering of the light due to the entrapped moisture, and it is this scattering that renders an initial sharp drop in the light output. The finding shows the importance of pore size of the silicone gel in order to prevent such sharp decrease in the light output under a humid environment.
URI: https://hdl.handle.net/10356/102789
http://hdl.handle.net/10220/16477
DOI: 10.1109/TDMR.2011.2173346
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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